Join us at the International Memory Workshop 2025 to discover our solutions designed for rapid and accurate characterization of emerging non-volatile memory technologies, facilitate faster time-to-market and enhanced engineering productivity.
đź“… [May 18th-21st 2025] | đź“Ť [Monterey, CA, USA]
đź”— [IEEE IMW 2025]
NplusT has achieved a major milestone with the granting of its second patent, further strengthening its intellectual property portfolio in cutting-edge testing solutions for electronic devices. This latest patent safeguards the company’s fast, multi-range, low-leakage current sensing circuitry, a critical technology for precise and efficient device evaluation, already applied in specific TESTMESH configurations.
Building on this momentum, NplusT is also advancing its third patent, currently pending approval. This innovation introduces a structured test system architecture, designed to interface seamlessly with electronic memory devices, optimizing the testing of matrix-arranged memory cells—particularly for emerging neuromorphic memory technologies. Such technology is the core of the TESTMESH TMC-100 equipment.
“These achievements reaffirm our commitment to technological excellence and continuous innovation.” said Tamas Kerekes, President and CEO of NplusT. “They further establish our company as a leading provider of non-volatile memory testing solutions, enabling the next generation of advanced memory devices.”
With a growing portfolio of proprietary technologies, NplusT continues to push the boundaries of non-volatile memory testing, delivering solutions that enhance speed, accuracy, and reliability in the rapidly evolving semiconductor landscape.
A leading European semiconductor manufacturer has chosen NplusT’s TESTMESH TMA-100 for the characterization of new emerging non-volatile technology devices. The decision was based on the significant speed advantage that TMA-100 offers, being several hundred times faster than competitive solutions.
As a tradition spanning more than a decade, NplusT assigned the MOCCA award also in 2023, honoring the user of NplusT products and services demonstrating the highest creativity, imagination, and dedication.
This year, the award was granted to the team of Weebit Nano, a provider of ReRAM non-volatile memory (NVM) technology, for their introduction of the TESTMESH TMA-100 NVM characterization equipment in their workflow. The Weebit team includes: Ori Livne, Director of Testing; Alessandro Bricalli PhD, R&D Engineer; Giuseppe Piccolboni PhD, R&D Engineer; and Matan Guttman, Test Engineer.
Tamás Kerekes, President and CEO of NplusT:
I have been following Weebit Nano since their very early days and I was impressed by how quickly the team was able to bring up a very new, extremely challenging technology. I am happy to support the company on their path to success. Weebit Nano is among the first users of our latest non-volatile memory characterization equipment, TESTMESH TMA-100, and certainly the first to apply it across multiple stages of technology development, from basic test devices to complex modules with embedded micro and digital interface. I am looking forward to continuing being part of Weebit Nano’s technology evaluation process.
Ilan Sever, VP of R&D, of Weebit Nano:
When developing a new memory technology like Weebit ReRAM, selecting the best testing and characterization solutions is a priority. We are delighted to partner with the team at NplusT, making its TESTMESH TMA-100 a key part of our flow. Together we designed the software, load boards and probe cards, going deep into every technical aspect.
At Weebit Nano, our products often have distinct working methodologies, and the TMA-100 easily accommodates these different procedures. This includes for example the ability to easily collaborate on the same platform with our R&D partner CEA-Leti.
Across our developments, the TMA-100 has saved us a lot of time and effort through product flexibility, the ability to reuse past developments, and the close support we receive from NplusT.
