May 6, 2024

NplusT – as gold sponsor of the event – will exhibit the TESTMESH non-volatile memory test system, aiming to accelerate the bring-up of novel technologies for data storage and in-memory neuromorphic computing.

Technology researchers and  product developers benefit from a compact, all-in-one instrument, embedding all resources necessary for the characterization. They can focus on the analysis rather than spending time and effort for the integration of a complex test bench. TESTMESH’s speed-optimized architecture and the engineering-oriented software accelerates their process to obtain reliable results.

Looking forward to meet you, see you in Seoul!

September 29, 2023

Nplust’s CTO Nicola Campanelli was a speaker at the recent Italian Mathematical Union conference Cryptography and Coding, held at University of Perugia’s Mathematics and Computer Science Department on September 21-22, 2023.

The presentation, titled “The Coding Theory ​in Flash Memory Applications” highlighted the theory’s importance in error correction, data degradation detection, and data loss prevention strategies when using high performance NAND memories. The presentation is available at this link.

July 26, 2023

Join us to witness how we help our customers build great storage devices!

We are excited to showcase our latest achievements in increasing performance, reliability and lifetime, while reducing power consumption of memory devices.

At NplusT, we provide state-of-the-art instrumentation and cutting-edge data analysis software that unlocks the full potential of flash and emerging non-volatile memory devices. Our solutions – optimized to shorten time-to-market – empower you to gain an in-depth view of device behavior, enabling data-driven technology improvement and optimal management algorithms.

See you at the FMS 2023 in Santa Clara (CA), Booth 758, 8-10 August!

For any inquiries or further information, or to book a demo, please contact us at

November 10, 2019

NplusT and JWILL have taken part to the 2019 edition of SEDEX, in Seoul. The show is one of the biggest events for the semiconductor industry worldwide, covering the fullspectrum of the memory supply chain and showcasing the latest advancements to more than 13000 visitors over three days.

SEDEX has been a great opportunity to introduce our NAND characterization and memory test solutions to South Korea’s industry professionals” states Tamás Kerekes, President and CEO of NplusT. “The country is one of the main global innovation hubs and a strategic market for our products. We look forward to strengthening our partnership with JWILL and provide our technology to Korea’s key industry players and research centers.”

September 3, 2019

NplusT has taken part in the 2019 edition of Flash Memory Summit in Santa Clara, California, the leading event for non-volatile memory and storage.

NplusT introduced the new version of NanoCycler which supports NAND characterization at 800 MT/sec and presented additional products and services helping SSD and other storage device makers obtain fast time-to-market.

Tamas Kerekes, President and CEO of NplusT, also tackled the reasons why NAND characterization at high speed is essential to building efficient and reliable SSD devices during his speech “Characterizing NAND Devices at High Speed – Why and How?”.

The presentation is available for download via this link.

August 1, 2019

NAND characterization is essential to understand features and behaviors of the latest components. It enables you to fine-tune the device management algorithms and the error correction strategy, to obtain the target performance and reliability of your SSD or other storage system.

Our NanoCycler – especially developed for NAND characterization, embedding dozens of years of experience and supported by a team of experts – provides a cost-effective, easy-to-use, flexible environment, matching the characterization requirements of the latest generation of NAND devices (3D, QLC, 1.2GT/sec) and it is extendible for other emerging technologies like X3D, MRAM, …

Come to visit us at Booth # 801

Schedule a meeting and demo with us.

March 5, 2019

NplusT took part in the TETRAMAX poster session held at the 2020 edition of HiPEAC, the main European forum for experts in computer architecture, programming models, compilers and operating systems for embedded and general-purpose systems, attracting over 500 delegates each year.

The poster session showcased the projects funded in the framework of the European “Smart Anything Everywhere (SAE)” initiative, in the domain of customized low energy computing (CLEC) for CPS and the IoT, including the “HS-CHAR: High Speed Characterization of Mass Storage Devices” technology transfer project carried out by NplusT and PCB Design and devilered in December 2019.

The results of the “HSCHAR” project contributed to upgrade NplusT’s technology for NAND characterization, paving the way for the forthcoming release of NanoCycler High Speed, the best-in-class and most cost effective solution for the exploration of the NAND memories.

August 1, 2018

The 2018 Flash Memory Summit is approaching quickly: NplusT will be there demonstrating the latest hardware and software solutions to fast track your memory technology. Our engineering test platforms and our data analysis software tools – developed especially for the NVM world and embedding the knowledge and experience of a long learning path – helped our customers to successfully bring up and consolidate emerging technologies very fast. We support our partners in the technology and product development as well as in the high volume production ramp up and monitoring. We have been busy over the last decade and we have expanded to become a worldwide vendor for companies – such as IDMs, foundries, technology providers, research institutes in Europe, in America and in Asia – which successfully applied the RIFLE tester and/or the BarnieMAT array analysis software.

Visit us at Booth 809 to try the tools we can provide to give you additional insight into your memory technology !
We would be pleased to show you our offerings:

  • RIFLE engineering test system with a test-array application
  • BarnieMAT with examples coming from real-life
  • NanoCycler, the latest test system targeting NAND reliability and performance analysis

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