NplusT is pleased to announce the receipt of a significant purchase order from IMEC, a world-leading research and innovation hub in nanoelectronics and digital technologies, for the supply of a TESTMESH TMA-100 platform together with a customized solution dedicated to the electrical characterization of advanced 3D NAND test chips.
The project addresses demanding technical challenges, including high-voltage generation, ultra-low current measurement, and exceptionally fast test execution. These requirements are crucial for next-generation non-volatile memory research, where precise control and measurement accuracy must be combined with high throughput within a flexible R&D environment.
The customized solution extends the flexibility of the TESTMESH TMA-100 platform, reinforcing its positioning as a scalable and modular test architecture for advanced semiconductor characterization. The system is being tailored to support complex device structures built on flash or emerging non-volatile technologies, while maintaining measurement integrity and optimized test time.
The system delivery is scheduled for 2026, with joint technical activities already underway.
We are excited to announce the release of TME-101, a customized small-size non-volatile memory cycling system designed for the qualification of NVM macros.
TME-101 combines the capabilities of a single-device precision tester with parallel operation, enabling engineers to obtain solid statistical insight without compromising on signal quality.
A key strength of the system is its high-accuracy signal generation and precise measurement capability, supporting detailed characterization throughout the cycling process.
Another distinctive feature is the integrated temperature control, which eliminates the need for an external climatic chamber. The system provides:
Very fast and accurate temperature transitions
Independent temperature control on each socket
This approach allows reliability profiles to be built quickly, with controlled and repeatable conditions on every device.
TME-101 is the first in a series of upcoming configurations designed to address the growing need for accurate device management and deep data collection, which traditional chamber-based cyclers struggle to provide. At the same time, this architecture remains significantly more cost-effective than general-purpose parallel test systems.
Advanced characterization environment for PCM (Phase Change Memory) test arrays
Since 2011, NplusT has presented the MOCCA (MOst Creative Customer Award) annually to recognize and celebrate the user team that demonstrates outstanding creativity in applying NplusT products to innovative and impactful projects. The award reflects the shared commitment to exploration, collaboration, and technological advancement.
For 2025, the MOCCA Award has been granted to the STMicroelectronics, Global Technology R&D – PCM Excellence Center team, composed of Giulia Samanni (ePCM Process Architecture & Device Reliability Staff Engineer), Enrico Gomiero (ePCM Device Architecture & Design Principal Engineer) and Alessandro Motta (ePCM Characterization Staff Engineer), and managed by Roberto Annunziata, for the creation of an advanced characterization environment for PCM (Phase Change Memory) test arrays.
Through their innovative approach, the STMicroelectronics team has developed a solution, based on NplusT’s TESTMESH TMA-100 instrumentation platform, that greatly enhances the speed and efficiency of device characterization, opening new opportunities for deeper analysis and faster iteration in memory technology development. Their project exemplifies how close collaboration and creative application of NplusT tools can translate into tangible performance breakthroughs. Tamas Kerekes, President and CEO of NplusT, commented:
“Working with the STMicroelectronics team was a perfect example of how shared technical curiosity and mutual trust can accelerate innovation. Their forward-thinking use of our NVM characterization tools to build a highly efficient PCM test environment not only demonstrates exceptional creativity but also sets a new benchmark for characterization speed. We are proud to see such a clear alignment between our vision and their execution.” Roberto Annunziata, Global Technology R&D – PCM Excellence Center Director, STMicroelectronics:
“NplusT provided a perfect framework for an effective collaboration. Technical expertise of our partners and strong motivation to find solutions enabled working as a unique team, exploiting the wide field of competencies. Results jointly achieved are a value for the current projects and an example for future collaborations in different domains.”
The STMicroelectronics Global Technology R&D PCM Excellence Center team and NplusT’s CTO Nicola Campanelli
Visit us at booth #951, at the Future of Memory and Storage Summit, August 5th-7th at the Santa Clara Convention Center in Santa Clara, California .
We will be exhibiting TESTMESH, our non-volatile memory test system, and NanoCycler, a full-feature NAND characterization equipment. Stop by to discover more about our solutions, optimized to accelerate the bring-up of novel technologies for data storage and for neuromorphic in-memory computing.
Join us at the International Memory Workshop 2025 to discover our solutions designed for rapid and accurate characterization of emerging non-volatile memory technologies, facilitate faster time-to-market and enhanced engineering productivity.
Since 2011, NplusT has presented the MOCCA (MOst Creative Customer Award) annually to recognize and celebrate the user team that demonstrates exceptional creativity in applying NplusT products to innovative and impactful projects. This award highlights the spirit of collaboration and innovation that drives technological progress.
MOCCA 2024 has been assigned to the IHP team, lead by Christian Wenger, Department Head, and including Andrea Baroni and Eduardo Perez, Scientists of the Material Research team, as first users of the TESTMESH TMC-100 configuration.
Tamas Kerekes, President and CEO of NplusT, shared his thoughts:
“Engaging with the IHP team to understand their unique requirements, we identified the significant market potential for a new TESTMESH configuration tailored to the specific characterization needs of neuromorphic computational arrays, built on cutting-edge non-volatile memory technologies. Together, our engineering teams conceptualized a solution that not only meets these demands but also positions us to deliver a groundbreaking characterization tool for this rapidly evolving market. I deeply value the shared commitment to innovation and the collaborative effort to design architectures that align seamlessly with the ever-changing landscape of technological advancements.”
Christian Wenger, Department Head, Material Research in IHP:
“The TESTMESH TMC-100 equipment from NplusT provides us the opportunity to investigate HfO2 based RRAM arrays in the 1T-1R configuration for Vector-Matrix-Multiplication application. The tailored set-up enables the programming the RRAM devices using complex algorithms as well as the interference process by addressing lines of the array. We are looking forward to present the first electrical results soon and to strengthen the collaboration between NplusT and IHP.”
IHP’s Andrea Baroni with TMC-100IHP’s Andrea Baroni And NplusT’s Alessandro Feriani with TMC-100
A prestigious European research center has selected NplusT’s TESTMESH TMC-100 for the advanced characterization of neuromorphic computational arrays based on emerging non-volatile technology. The exceptional speed and precision of the TMC-100, operating at hundreds of times faster than competitors, was a key factor in their decision.
This new installation marks the continuation of over 10 years of collaboration, and we are thrilled to further strengthen our partnership.
Visit us at booth #749, at the Future of Memory and Storage Summit, August 6th-8th at the Santa Clara Convention Center in Santa Clara, California.
We will be exhibiting TESTMESH, our non-volatile memory test system, and NanoCycler, a full-feature NAND characterization equipment. Stop by to discover more about our solutions, optimized to accelerate the bring-up of novel technologies for data storage and for neuromorphic in-memory computing.
A leading European semiconductor manufacturer has chosen NplusT’s TESTMESH TMA-100 for the characterization of new emerging non-volatile technology devices. The decision was based on the significant speed advantage that TMA-100 offers, being several hundred times faster than competitive solutions.
NplusT – as gold sponsor of the event – will exhibit the TESTMESH non-volatile memory test system, aiming to accelerate the bring-up of novel technologies for data storage and in-memory neuromorphic computing.
Technology researchers and product developers benefit from a compact, all-in-one instrument, embedding all resources necessary for the characterization. They can focus on the analysis rather than spending time and effort for the integration of a complex test bench. TESTMESH’s speed-optimized architecture and the engineering-oriented software accelerates their process to obtain reliable results.
