NVM – NplusT

We are excited to announce the release of TME-101, a customized small-size non-volatile memory cycling system designed for the qualification of NVM macros.

TME-101 combines the capabilities of a single-device precision tester with parallel operation, enabling engineers to obtain solid statistical insight without compromising on signal quality.
A key strength of the system is its high-accuracy signal generation and precise measurement capability, supporting detailed characterization throughout the cycling process.

Another distinctive feature is the integrated temperature control, which eliminates the need for an external climatic chamber. The system provides:

Very fast and accurate temperature transitions
Independent temperature control on each socket

This approach allows reliability profiles to be built quickly, with controlled and repeatable conditions on every device.

TME-101 is the first in a series of upcoming configurations designed to address the growing need for accurate device management and deep data collection, which traditional chamber-based cyclers struggle to provide. At the same time, this architecture remains significantly more cost-effective than general-purpose parallel test systems.

More breakthroughs are coming.

Advanced characterization environment for PCM (Phase Change Memory) test arrays

Since 2011, NplusT has presented the MOCCA (MOst Creative Customer Award) annually to recognize and celebrate the user team that demonstrates outstanding creativity in applying NplusT products to innovative and impactful projects. The award reflects the shared commitment to exploration, collaboration, and technological advancement.
For 2025, the MOCCA Award has been granted to the STMicroelectronics, Global Technology R&D – PCM Excellence Center team, composed of Giulia Samanni (ePCM Process Architecture & Device Reliability Staff Engineer), Enrico Gomiero (ePCM Device Architecture & Design Principal Engineer) and Alessandro Motta (ePCM Characterization Staff Engineer), and managed by Roberto Annunziata, for the creation of an advanced characterization environment for PCM (Phase Change Memory) test arrays.
Through their innovative approach, the STMicroelectronics team has developed a solution, based on NplusT’s TESTMESH TMA-100 instrumentation platform, that greatly enhances the speed and efficiency of device characterization, opening new opportunities for deeper analysis and faster iteration in memory technology development. Their project exemplifies how close collaboration and creative application of NplusT tools can translate into tangible performance breakthroughs.
Tamas Kerekes, President and CEO of NplusT, commented:
“Working with the STMicroelectronics team was a perfect example of how shared technical curiosity and mutual trust can accelerate innovation. Their forward-thinking use of our NVM characterization tools to build a highly efficient PCM test environment not only demonstrates exceptional creativity but also sets a new benchmark for characterization speed. We are proud to see such a clear alignment between our vision and their execution.”
Roberto Annunziata, Global Technology R&D – PCM Excellence Center Director, STMicroelectronics:
“NplusT provided a perfect framework for an effective collaboration. Technical expertise of our partners and strong motivation to find solutions enabled working as a unique team, exploiting the wide field of competencies. Results jointly achieved are a value for the current projects and an example for future collaborations in different domains.”

The STMicroelectronics Global Technology R&D PCM Excellence Center team and NplusT's CTO Nicola Campanelli — The STMicroelectronics Global Technology R&D PCM Excellence Center team and NplusT’s CTO Nicola Campanelli

Visit us at booth #951, at the Future of Memory and Storage Summit, August 5^th-7^th at the Santa Clara Convention Center in Santa Clara, California .

We will be exhibiting TESTMESH, our non-volatile memory test system, and NanoCycler, a full-feature NAND characterization equipment. Stop by to discover more about our solutions, optimized to accelerate the bring-up of novel technologies for data storage and for neuromorphic in-memory computing.

Join us at the International Memory Workshop 2025 to discover our solutions designed for rapid and accurate characterization of emerging non-volatile memory technologies, facilitate faster time-to-market and enhanced engineering productivity.

📅 [May 18th-21st 2025] | 📍 [Monterey, CA, USA]
🔗 [IEEE IMW 2025]

Since 2011, NplusT has presented the MOCCA (MOst Creative Customer Award) annually to recognize and celebrate the user team that demonstrates exceptional creativity in applying NplusT products to innovative and impactful projects. This award highlights the spirit of collaboration and innovation that drives technological progress.

MOCCA 2024 has been assigned to the IHP team, lead by Christian Wenger, Department Head, and including Andrea Baroni and Eduardo Perez, Scientists of the Material Research team, as first users of the TESTMESH TMC-100 configuration.

Tamas Kerekes, President and CEO of NplusT, shared his thoughts:

“Engaging with the IHP team to understand their unique requirements, we identified the significant market potential for a new TESTMESH configuration tailored to the specific characterization needs of neuromorphic computational arrays, built on cutting-edge non-volatile memory technologies. Together, our engineering teams conceptualized a solution that not only meets these demands but also positions us to deliver a groundbreaking characterization tool for this rapidly evolving market. I deeply value the shared commitment to innovation and the collaborative effort to design architectures that align seamlessly with the ever-changing landscape of technological advancements.”

Christian Wenger, Department Head, Material Research in IHP:

“The TESTMESH TMC-100 equipment from NplusT provides us the opportunity to investigate HfO2 based RRAM arrays in the 1T-1R configuration for Vector-Matrix-Multiplication application. The tailored set-up enables the programming the RRAM devices using complex algorithms as well as the interference process by addressing lines of the array. We are looking forward to present the first electrical results soon and to strengthen the collaboration between NplusT and IHP.”

IHP’s Andrea Baroni And NplusT’s Alessandro Feriani with TMC-100

In the past, MOCCA was assigned to:

2011 Macronix
2012 STMicroelectronics
2013 IHP
2014 Infineon
2015 Tower
2016 STMicroelectronics
2017 Microsemi
2018 GAMAX
2019 Infineon
2020 LETI
2021 TENAFE
2022 STMicroelectronics
2023 WEEBIT

A prestigious European research center has selected NplusT’s TESTMESH TMC-100 for the advanced characterization of neuromorphic computational arrays based on emerging non-volatile technology. The exceptional speed and precision of the TMC-100, operating at hundreds of times faster than competitors, was a key factor in their decision.

This new installation marks the continuation of over 10 years of collaboration, and we are thrilled to further strengthen our partnership.

Visit us at booth #749, at the Future of Memory and Storage Summit, August 6^th-8^th at the Santa Clara Convention Center in Santa Clara, California.

We will be exhibiting TESTMESH, our non-volatile memory test system, and NanoCycler, a full-feature NAND characterization equipment. Stop by to discover more about our solutions, optimized to accelerate the bring-up of novel technologies for data storage and for neuromorphic in-memory computing.

A leading European semiconductor manufacturer has chosen NplusT’s TESTMESH TMA-100 for the characterization of new emerging non-volatile technology devices. The decision was based on the significant speed advantage that TMA-100 offers, being several hundred times faster than competitive solutions.

NplusT – as gold sponsor of the event – will exhibit the TESTMESH non-volatile memory test system, aiming to accelerate the bring-up of novel technologies for data storage and in-memory neuromorphic computing.

Technology researchers and product developers benefit from a compact, all-in-one instrument, embedding all resources necessary for the characterization. They can focus on the analysis rather than spending time and effort for the integration of a complex test bench. TESTMESH’s speed-optimized architecture and the engineering-oriented software accelerates their process to obtain reliable results.

Looking forward to meet you, see you in Seoul!

As a tradition spanning more than a decade, NplusT assigned the MOCCA award also in 2023, honoring the user of NplusT products and services demonstrating the highest creativity, imagination, and dedication.

This year, the award was granted to the team of Weebit Nano, a provider of ReRAM non-volatile memory (NVM) technology, for their introduction of the TESTMESH TMA-100 NVM characterization equipment in their workflow. The Weebit team includes: Ori Livne, Director of Testing; Alessandro Bricalli PhD, R&D Engineer; Giuseppe Piccolboni PhD, R&D Engineer; and Matan Guttman, Test Engineer.

Tamás Kerekes, President and CEO of NplusT:

I have been following Weebit Nano since their very early days and I was impressed by how quickly the team was able to bring up a very new, extremely challenging technology. I am happy to support the company on their path to success. Weebit Nano is among the first users of our latest non-volatile memory characterization equipment, TESTMESH TMA-100, and certainly the first to apply it across multiple stages of technology development, from basic test devices to complex modules with embedded micro and digital interface. I am looking forward to continuing being part of Weebit Nano’s technology evaluation process.

Ilan Sever, VP of R&D, of Weebit Nano:

When developing a new memory technology like Weebit ReRAM, selecting the best testing and characterization solutions is a priority. We are delighted to partner with the team at NplusT, making its TESTMESH TMA-100 a key part of our flow. Together we designed the software, load boards and probe cards, going deep into every technical aspect.
At Weebit Nano, our products often have distinct working methodologies, and the TMA-100 easily accommodates these different procedures. This includes for example the ability to easily collaborate on the same platform with our R&D partner CEA-Leti.
Across our developments, the TMA-100 has saved us a lot of time and effort through product flexibility, the ability to reuse past developments, and the close support we receive from NplusT.

Weebit’s Ori Livne (left) and Matan Guttman (right) with the TESTMESH TMA-100

TME-101 released

MOCCA 2025 awarded to STMicroelectronics

NplusT at FMS 2025

NplusT at IMW 2025

MOCCA 2024 awarded to IHP

TESTMESH TMC-100 Installed at Leading European Research Center

Visit us at FMS 2024 – August 6-8, Santa Clara, California

New Purchase Order for TESTMESH TMA-100

Visit us at the International Memory Workshop – Seoul, 12-15 May 2024!

MOCCA 2023 awarded to Weebit Nano

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