TMA-100 is the first member of NplusT’s TESTMESH, the new engineering tester platform, based on a breakthrough architecture concept.

TMA-100 represents a high-performance, cost-optimized, all-in-one instrument for the development and engineering of novel non-volatile memory technologies.

Evaluation and characterization of single cell devices and test arrays requires:

• Accurate generation of analog waveforms
• Extremely fast current sensing
• Algorithmic execution of complex write/erase/set/reset procedures

The combination of these tasks and their fast execution is a crucial factor, in order to perform millions and even billions of cycles in a reasonable time: using traditional instrumentation it might take years! TMA-100 especially architected for this tasks can reduce those times by 3-4 orders of magnitude by:

• Arbitrary and algorithmic, 200MHz waveform generators with dynamic impedance control and with pulse selection in microseconds
• Fast current sensing circuits with setup time below microsecond and sampling speed in the dozens of nanosecond domain
• Current measurement range switch time in microseconds, essential to obtain write pulses and suitable read scales
• Threshold-programmable one-bit ADC to detect if the cell reached the desired state (sense amplifier emulation)
• Flexible, programmable hardware sequencer to reduce the interaction with the software

• Programmable switch matrix to route the TMA-100 resources to the terminals of the device under test
• Low level API for extreme flexibility
• Mid level API for easy programming in C++ and Python
• Graphical user interface for waveform, cycle and flow definition
• Seamless interface with BarnieMAT, the array data analysis software

• Algorithmic and blind cycling
• Characterization (IV) at programmable cycles
• Topologic pattern generation
• Various disturb operations (read, topologic)

• Non-volatile technology evaluation at single cell or at test array level
• Evaluation of IP modules with digital interface still providing analog access to the cells
• Process qualification
• Process monitor
• Wafer and package level testing