NanoCycler – NplusT

NplusT is pleased to announce the delivery of a NanoCycler to a customer in the United States. The equipment will be deployed to characterize NAND memory devices, configured to support the specific requirements of radiation testing and aerospace qualification.

The order underscores NanoCycler’s proven capability to deliver highly accurate, package-level characterization data—covering aging, endurance, retention, timing, and power profiling—under the demanding conditions required by mission-critical aerospace systems. Its fully independent per-package test architecture allows engineers to tailor test flows precisely to radiation and environmental test protocols, making it a natural fit for space and defense-grade qualification work.

Tamas Kerekes, President and CEO of NplusT, comments: “The project is another important milestone of our activities for the aerospace industry, started with a project launched in 2025 with ESA, PCB Design and Thales, and now reaching its final stage. This new delivery confirms the relevance of our technology for radiation testing and aerospace-grade qualification, and reflects the growing international recognition of NanoCycler as a reference NAND characterization platform.”

We are pleased to announce a new release of the NanoCycler library, delivering significant performance improvements for NAND BER (Bit Error Rate) collection and datalog generation.

Over time, we identified that one of the main performance limitations of the Python library was the time required to calculate NAND page bit errors and generate the associated datalog. This overhead could have a noticeable impact on total execution time, particularly for complex test flows.

With WS version 4.3.3, NanoCycler now includes native, integrated datalog support, substantially accelerating failure collection and reducing overall execution time by more than 3×.

For example, a complete TLC block of approximately 2,000 pages, tested across all Read Retry entries, now takes approximately:

20 seconds → 6 seconds

This optimization applies broadly to operations that require NAND BER extraction and generation of test log reports.

The result is faster test execution, more efficient failure analysis, and improved productivity for NAND characterization and reliability testing.

NplusT today announced two important upgrades to its NanoCycler HS24 product line, enhancing performance and extending applicability for NAND characterization.

New NanoCycler HS24 BGA154 Tester Unit (rev2)

The new version of the NanoCycler HS24 BGA154 tester unit introduces standby current measurement with approx. 1 µA resolution, enabling more precise power characterization. The updated unit maintains full mechanical and software compatibility with existing systems and will be available at the same price as the previous version. Orders are open now, with deliveries starting in 3–4 months.

Industrial Temperature Range Configuration

NplusT has created a specific version and qualified both the HS24 BGA152 and BGA154 tester units for the industrial temperature range, enabling reliable testing of SSD devices for automotive and industrial applications. Integration with a climatic chamber is required, and NplusT offers engineering support to ensure smooth implementation.

“Our mission is to help SSD makers understand the behavior of the most recent NAND devices, accelerate development and ensure product reliability under real-world conditions,” said Tamas Kerekes, President and CEO of NplusT. “With these upgrades, the NanoCycler platform is now even more versatile, addressing the demanding requirements of industrial and automotive markets.”

For more information, please contact:

Davide Zini
Sales Director
davide.zini@n-plus-t.com

or one of our sales partners.

Visit us at booth #951, at the Future of Memory and Storage Summit, August 5^th-7^th at the Santa Clara Convention Center in Santa Clara, California .

We will be exhibiting TESTMESH, our non-volatile memory test system, and NanoCycler, a full-feature NAND characterization equipment. Stop by to discover more about our solutions, optimized to accelerate the bring-up of novel technologies for data storage and for neuromorphic in-memory computing.

NplusT’s technology was recently featured in a research publication and played a critical role in enabling precise data collection and testing. Using NanoCycler as core tool for acquiring real-device data during the entire NAND life cycle, Luo Zheng’s dissertation, titled “Research and Development of Efficient Testing Technology for Ultra-large Capacity 3D Flash Memory”, delves into enhancing the reliability and lifespan of 3D NAND flash memory.

Written under the guidance of Prof. Han Guojun at the Department of Electronic Information, Guangdong University of Technology, in Guangzhou, China, the research focuses on developing machine learning models to accurately predict flash memory lifespan. The work aims to optimize storage system performance by reducing the impact of noise on lifespan prediction accuracy.

The NplusT team extends their congratulations to Luo Zheng for earning the degree of Master of Electronic Information.

Visit us at booth #749, at the Future of Memory and Storage Summit, August 6^th-8^th at the Santa Clara Convention Center in Santa Clara, California.

We will be exhibiting TESTMESH, our non-volatile memory test system, and NanoCycler, a full-feature NAND characterization equipment. Stop by to discover more about our solutions, optimized to accelerate the bring-up of novel technologies for data storage and for neuromorphic in-memory computing.

Tamas Kerekes, CEO and President of Nplust, was a speaker in the recent seminar held on December 14th at the Faculty of Computer Science of the University of Ferrara, alongside prominent names from the Storage industry and research. The presentation, titled “Make the NAND Work” is available at this link.

Join us to witness how we help our customers build great storage devices!

We are excited to showcase our latest achievements in increasing performance, reliability and lifetime, while reducing power consumption of memory devices.

At NplusT, we provide state-of-the-art instrumentation and cutting-edge data analysis software that unlocks the full potential of flash and emerging non-volatile memory devices. Our solutions – optimized to shorten time-to-market – empower you to gain an in-depth view of device behavior, enabling data-driven technology improvement and optimal management algorithms.

See you at the FMS 2023 in Santa Clara (CA), Booth 758, 8-10 August!

For any inquiries or further information, or to book a demo, please contact us at info@n-plus-t.com

NplusT is proud to announce the general availability of NanoCycler HS24, an upgraded version of the HS20. Using HS24, our partners are able to characterize the array performance, power consumption and interface timing of every NAND device at its highest operational speed, with full coverage of the ONFi 5.0 specification. HS24 is available for BGA132, BGA152 and BGA154 packages.

HS24 maintains all advanced features of the NanoCycler family: characterization in the full range of speed-temperature-voltage conditions, at extreme accuracy and flexibility. HS24 is software compatible with the HS16 and HS20 product versions.

NplusT has released NanoCycler HS20 for BGA132, BGA152, and BGA154 configurations, the fastest and most feature-rich NAND characterization tester today, supporting 2.0 GT/sec NAND interface speed.
The company forecasts to come out with a further upgrade later this year, to reach 2.4GT/sec.

For more info, please see the complete Press Release or StorageNewsletter.com.

NplusT Delivers NanoCycler to U.S. Aerospace Customer

New NanoCycler Library Release Improves NAND Failure Collection Performance

NplusT Announces Major Upgrades to NanoCycler Product Line for NAND Characterization

NplusT at FMS 2025

NanoCycler Powers Research in 3D Flash Memory Lifespan Prediction: Luo Zheng Earns Master’s Degree at Guangdong University of Technology

Visit us at FMS 2024 – August 6-8, Santa Clara, California

NplusT at the University of Ferrara Storage Seminar

We Make the Flash Work – Join Us at the Flash Memory Summit 2023

NanoCycler HS24 – The First and Only Characterization Tester for ONFI 5.0 NAND at 2.4 GT/sec

NplusT releases NanoCycler HS20

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