October 13, 2022

NplusT is proud to announce the general availability of NanoCycler HS24, an upgraded version of the HS20. Using HS24, our partners are able to characterize the array performance, power consumption and interface timing of every NAND device at its highest operational speed, with full coverage of the ONFi 5.0 specification. HS24 is available for BGA132, BGA152 and BGA154 packages.

HS24 maintains all advanced features of the NanoCycler family: characterization in the full range of speed-temperature-voltage conditions, at extreme accuracy and flexibility. HS24 is software compatible with the HS16 and HS20 product versions.

 

 



June 7, 2022

NplusT announces it has been granted a new patent entitled “Sistema per la caratterizzazione di memorie non volatili” (“Non-volatile Memories Characterization System”).
The patented technology expands upon the company’s intellectual property rights relating to non-volatile memory testing and characterization and has been successfully integrated into the NanoCycler test system.

Thanks to its proprietary architecture, NanoCycler proves to be the leading solution for the industry’s most demanding NAND characterization needs, providing outstanding scalability (from single-socket development station until multiples of 84-socket racks), full, per-package independency for test execution and temperature control, cutting edge performance with data transfer up to 2.0GT/sec (2.4GT/sec coming soon) and an overall unmatched feature-rich hardware and software solution; to help SSD developers to increase lifetime and reliability of their products.



April 4, 2022

The MOCCA 2021 has been assigned to the TenaFe NAND Characterization Team, lead by Curry Zhang & Sean Huang.
NplusT grants MOCCA (MOst Creative Customer Award) to users of NplusT products and services who leverage the most of the features and performance of such products making use of innovative approaches.

Tamas Kerekes, President and CEO of NplusT:
“I am really happy to see the level of understanding of the NAND, what Tenafe reached using NanoCycler. Curry with his team have developed a powerful infrastructure on top of the API provided with NanoCycler, and are using it efficiently to generate the necessary data and knowledge. This is the first time that MOCCA goes to China – I am extremely pleased about that, as I see a very fast evolution in technology and knowledge. The Chinese storage industry is evolving very fast, it is one of our strategic market targets: today we have several users of our products and technologies in China.

Curry Zhang, Senior Validation Manager of TenaFe:
“We’ve used NplusT NanoCycler for over 2 years, with the main purpose of NAND characterization, collecting data for our media management algorithm. As an SSD controller company, we need to adopt NAND from different vendors. Although we have our own controller and silicon, NanoCycler is still very helpful as a 3rd party tool. We use it frequently, every month, almost every week, for these reasons:

  • It has powerful NAND command API: we can development testsuites on top of; and it is flexible enough to support all kinds of NAND. When we get a new NAND, we only need 1 or 2 days to bring it up on NanoCycler, then we can start collecting the data we want;
  • It is very stable, we usually run it for weeks;
  • It has its own temperature control system, which is very impressive: we can easily and automatically control NAND temperature as whatever we want, for example erase and program in 30°C, read in 70°C, and we don’t even need to have a chamber to do so;
  • Within the last 2 years, we finished NAND characterization of more than 8 different NAND types from various vendors;
  • Last thing and most importantly, engineers of NplusT are nice and professional: we communicated a lot and they always gave us quick responses and an efficient support.”



March 15, 2022

NplusT released the latest member of the NanoCycler family, the HS20 BGA152. This tester is the first on the market reaching the 2,000 MT/sec data exchange rate between tester and NAND devices.

“SSD performance is increasing tremendously and NAND vendors are keeping pace. SSD makers need to characterize the NAND in conditions as much similar as possible like the NAND will work in the final application, including interface speed. Reaching the 2.0GT/sec transfer rate is an important milestone of our roadmap, ensuring our customers to apply solid, proven solutions in the right time. We are continuing our development and we plan to release further enhancements reflecting the ONFI 5 standard like the BGA154 package support, the new LP-NVDDR4 protocol and also reaching 2.4 GT/sec and beyond – said Tamas Kerekes, President and CEO of NplusT.

NanoCycler HS20 Tester Unit



January 10, 2022

NplusT took part in the workshop titled “Finding the way of solving reliability issues of the next generation NAND flash memories”, organized by CCF YOCSEF Shanghai (China Computer Federation, Young Computer Scientists Engineers Forum) and held the December 18, 2021.

The meeting was a great occasion to exchange experience and ideas by several industry and academic experts.
Tamas Kerekes presented the paper “NAND Characterization for ONFI5 and Beyond”. The integral version is available at this link.



December 6, 2021

NplusT delivered 3 large size NanoCycler HS equipment to an important Chinese customer.

Based on its innovative architecture, the system allows to execute up to 252 fully independent tests, including package level thermal control, on NAND memories at the same time. The communication speed with the devices under test reaches 1.6 GT/sec on two channels in parallel, with zero-overhead pattern generation and pattern matching.

These equipments – being able to test the latest and future generation of NAND devices – aim at enhancing the customer’s development flow in the implementation of data centers and high-performance storage applications.

Tamas Kerekes, President and CEO of NplusT declared: “When building the equipment, we had to face the serious challenge of the component shortage. Our engineering team provided an excellent answer: the necessary design changes further improved system performance. We have been able to design, qualify, manufacture and test in a really short time. Now, our expectation is to see our customer executing efficiently their characterization and sorting tasks, we will provide them all necessary support. The delivery of these equipment also represents an important milestone to increase our presence in China, which is our fastest growing market today.”



November 24, 2020

The speed and complexity of the latest TLC and QLC flash technologies set new challenges in designing large capacity high performance SSD devices, from the hardware (signal integrity, power management) and the firmware (flash algorithms, error correction) point of view. Massive amounts of accurate data must be collected and analyzed to characterize the flash endurance, errors, defects, operation’s timing and power.
NanoCycler HS, bundled with BarnieMAT data analytics, provides the best-in-class and most cost effective solution for the exploration of the NAND memories.

NanoCycler HS:

Supports endurance and functional testing of NAND devices by providing C++ and Python API with full ONFI command set and with customizable signal sequences.

Exercises and stresses at-speed – up to 1.6 GT/sec – the devices under test faithfully replicating the use conditions of the application.

Provides high-accuracy – 10 mV precision – programmable power supplies for accurate voltage margins analysis.

Captures the power consumption for each supply at 50 nsec sampling rate with 1 mA resolution. Flash operations power consumption data are processed in real time to provide high resolution current consumption traces, and key metrics (peak, average, distributions) over long period of time.

Characterizes the flash interface timing with 1 nsec I/O edge placement and 20 nsec flash response time acquisition.

Has a scalable and expandable architecture, from 1 to 48 test sites, to optimize cost and long term investment.

Allows full independence of the test sites where each device under test can run at individual temperature, timing, voltage levels, with different test programs.

Integrates the data analysis environment to post-process and present the results to accelerate time to product.

Highest quality characterization results at the lowest cost and effort – NanoCycler HS represents a future-safe investment to design high-performance reliable mass storage devices.


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