September 27, 2024

NplusT’s technology was recently featured in a research publication and played a critical role in enabling precise data collection and testing. Using NanoCycler as core tool for acquiring real-device data during the entire NAND life cycle, Luo Zheng’s dissertation, titled “Research and Development of Efficient Testing Technology for Ultra-large Capacity 3D Flash Memory”, delves into enhancing the reliability and lifespan of 3D NAND flash memory.

Written under the guidance of Prof. Han Guojun at the Department of Electronic Information, Guangdong University of Technology, in Guangzhou, China, the research focuses on developing machine learning models to accurately predict flash memory lifespan. The work aims to optimize storage system performance by reducing the impact of noise on lifespan prediction accuracy.

The NplusT team extends their congratulations to Luo Zheng for earning the degree of Master of Electronic Information.



July 25, 2024

Visit us at booth #749, at the Future of Memory and Storage Summit, August 6th-8th at the Santa Clara Convention Center in Santa Clara, California.

We will be exhibiting TESTMESH, our non-volatile memory test system, and NanoCycler, a full-feature NAND characterization equipment. Stop by to discover more about our solutions, optimized to accelerate the bring-up of novel technologies for data storage and for neuromorphic in-memory computing.



October 13, 2022

NplusT is proud to announce the general availability of NanoCycler HS24, an upgraded version of the HS20. Using HS24, our partners are able to characterize the array performance, power consumption and interface timing of every NAND device at its highest operational speed, with full coverage of the ONFi 5.0 specification. HS24 is available for BGA132, BGA152 and BGA154 packages.

HS24 maintains all advanced features of the NanoCycler family: characterization in the full range of speed-temperature-voltage conditions, at extreme accuracy and flexibility. HS24 is software compatible with the HS16 and HS20 product versions.

 

 



June 7, 2022

NplusT announces it has been granted a new patent entitled “Sistema per la caratterizzazione di memorie non volatili” (“Non-volatile Memories Characterization System”).
The patented technology expands upon the company’s intellectual property rights relating to non-volatile memory testing and characterization and has been successfully integrated into the NanoCycler test system.

Thanks to its proprietary architecture, NanoCycler proves to be the leading solution for the industry’s most demanding NAND characterization needs, providing outstanding scalability (from single-socket development station until multiples of 84-socket racks), full, per-package independency for test execution and temperature control, cutting edge performance with data transfer up to 2.0GT/sec (2.4GT/sec coming soon) and an overall unmatched feature-rich hardware and software solution; to help SSD developers to increase lifetime and reliability of their products.



April 4, 2022

The MOCCA 2021 has been assigned to the TenaFe NAND Characterization Team, lead by Curry Zhang & Sean Huang.
NplusT grants MOCCA (MOst Creative Customer Award) to users of NplusT products and services who leverage the most of the features and performance of such products making use of innovative approaches.

Tamas Kerekes, President and CEO of NplusT:
“I am really happy to see the level of understanding of the NAND, what Tenafe reached using NanoCycler. Curry with his team have developed a powerful infrastructure on top of the API provided with NanoCycler, and are using it efficiently to generate the necessary data and knowledge. This is the first time that MOCCA goes to China – I am extremely pleased about that, as I see a very fast evolution in technology and knowledge. The Chinese storage industry is evolving very fast, it is one of our strategic market targets: today we have several users of our products and technologies in China.

Curry Zhang, Senior Validation Manager of TenaFe:
“We’ve used NplusT NanoCycler for over 2 years, with the main purpose of NAND characterization, collecting data for our media management algorithm. As an SSD controller company, we need to adopt NAND from different vendors. Although we have our own controller and silicon, NanoCycler is still very helpful as a 3rd party tool. We use it frequently, every month, almost every week, for these reasons:

  • It has powerful NAND command API: we can development testsuites on top of; and it is flexible enough to support all kinds of NAND. When we get a new NAND, we only need 1 or 2 days to bring it up on NanoCycler, then we can start collecting the data we want;
  • It is very stable, we usually run it for weeks;
  • It has its own temperature control system, which is very impressive: we can easily and automatically control NAND temperature as whatever we want, for example erase and program in 30°C, read in 70°C, and we don’t even need to have a chamber to do so;
  • Within the last 2 years, we finished NAND characterization of more than 8 different NAND types from various vendors;
  • Last thing and most importantly, engineers of NplusT are nice and professional: we communicated a lot and they always gave us quick responses and an efficient support.”



March 15, 2022

NplusT released the latest member of the NanoCycler family, the HS20 BGA152. This tester is the first on the market reaching the 2,000 MT/sec data exchange rate between tester and NAND devices.

“SSD performance is increasing tremendously and NAND vendors are keeping pace. SSD makers need to characterize the NAND in conditions as much similar as possible like the NAND will work in the final application, including interface speed. Reaching the 2.0GT/sec transfer rate is an important milestone of our roadmap, ensuring our customers to apply solid, proven solutions in the right time. We are continuing our development and we plan to release further enhancements reflecting the ONFI 5 standard like the BGA154 package support, the new LP-NVDDR4 protocol and also reaching 2.4 GT/sec and beyond – said Tamas Kerekes, President and CEO of NplusT.

NanoCycler HS20 Tester Unit



January 10, 2022

NplusT took part in the workshop titled “Finding the way of solving reliability issues of the next generation NAND flash memories”, organized by CCF YOCSEF Shanghai (China Computer Federation, Young Computer Scientists Engineers Forum) and held the December 18, 2021.

The meeting was a great occasion to exchange experience and ideas by several industry and academic experts.
Tamas Kerekes presented the paper “NAND Characterization for ONFI5 and Beyond”. The integral version is available at this link.


Legal Office

Loc. Castelfranco 132
05026 Montecastrilli
Terni, Italy

+39 075 5714845

info@n-plus-t.com

Laboratories

Via Donatella 12
06132 San Martino in Campo
Perugia, Italy

Capitale Sociale (Paid-up Capital) € 121.000,00 I.V.
Cod. Fisc. / Partita IVA (Vat Number) 00702760554
Sede CCIAA / n. REA : TR / 69772, PG / 272888
Iscriz. Reg. Imprese TR n. 00702760554


Privacy