NplusT is pleased to announce the receipt of a significant purchase order from IMEC, a world-leading research and innovation hub in nanoelectronics and digital technologies, for the supply of a TESTMESH TMA-100 platform together with a customized solution dedicated to the electrical characterization of advanced 3D NAND test chips.

The project addresses demanding technical challenges, including high-voltage generation, ultra-low current measurement, and exceptionally fast test execution. These requirements are crucial for next-generation non-volatile memory research, where precise control and measurement accuracy must be combined with high throughput within a flexible R&D environment.

The customized solution extends the flexibility of the TESTMESH TMA-100 platform, reinforcing its positioning as a scalable and modular test architecture for advanced semiconductor characterization. The system is being tailored to support complex device structures built on flash or emerging non-volatile technologies, while maintaining measurement integrity and optimized test time.

The system delivery is scheduled for 2026, with joint technical activities already underway.