NplusT has successfully completed the factory buy-off and shipped a customized TESTMESH TMA-100 system to imec, for the characterization and reliability evaluation of advanced 3D NAND test structures.
The solution is based on the TESTMESH TMA-100 platform combined with the TXU-NAND Extension Unit, developed to address the demanding electrical and connectivity requirements of complex 3D NAND test arrays.
Key capabilities:
- 32 bitlines and 32 wordlines, 8 banks with independently controlled top and bottom selectors, up to 8 source lines;
- Measurement on both bitlines and source lines;
- Fully analog stimulus and measurement, high-voltage operation up to 30 V, current sensing down to the nA range;
- High-speed execution for endurance and reliability tests with very large numbers of program/erase/measure cycles, monitoring degradation continuously.
The modular TESTMESH architecture also allows the TXU-NAND Extension Unit to be positioned close to the probe station, minimizing critical signal paths and supporting signal integrity, while the main TMA-100 system can be located remotely.
Beyond the hardware, NplusT provides a library of NAND-specific test and characterization algorithms. Test flows and measurement sequences are fully programmable in Python and C++, providing researchers with the flexibility to implement and automate customized characterization methodologies. The system can also control automated probe stations, enabling complete wafer-level characterization and reliability test flows.
For this specific customer configuration, the complete equipment and software environment operates under Linux.
The shipment follows the purchase order announced earlier this year and marks the successful completion of the development, integration and factory acceptance phase of the project.
With the system now moving to imec, NplusT continues to expand the TESTMESH platform from emerging-memory characterization into advanced 3D NAND research, endurance testing and reliability evaluation.
