October 7, 2026

NplusT has successfully completed the factory buy-off and shipped a customized TESTMESH TMA-100 system to imec, for the characterization and reliability evaluation of advanced 3D NAND test structures.

The solution is based on the TESTMESH TMA-100 platform combined with the TXU-NAND Extension Unit, developed to address the demanding electrical and connectivity requirements of complex 3D NAND test arrays.

Key capabilities:

  • 32 bitlines and 32 wordlines, 8 banks with independently controlled top and bottom selectors, up to 8 source lines;
  • Measurement on both bitlines and source lines;
  • Fully analog stimulus and measurement, high-voltage operation up to 30 V, current sensing down to the nA range;
  • High-speed execution for endurance and reliability tests with very large numbers of program/erase/measure cycles, monitoring degradation continuously.

The modular TESTMESH architecture also allows the TXU-NAND Extension Unit to be positioned close to the probe station, minimizing critical signal paths and supporting signal integrity, while the main TMA-100 system can be located remotely.

Beyond the hardware, NplusT provides a library of NAND-specific test and characterization algorithms. Test flows and measurement sequences are fully programmable in Python and C++, providing researchers with the flexibility to implement and automate customized characterization methodologies. The system can also control automated probe stations, enabling complete wafer-level characterization and reliability test flows.

For this specific customer configuration, the complete equipment and software environment operates under Linux.

The shipment follows the purchase order announced earlier this year and marks the successful completion of the development, integration and factory acceptance phase of the project.

With the system now moving to imec, NplusT continues to expand the TESTMESH platform from emerging-memory characterization into advanced 3D NAND research, endurance testing and reliability evaluation.

TESTMESH TMA-100 and TXU NAND
TESTMESH TMA-100 and TXU-NAND


September 9, 2026

NplusT is pleased to announce the delivery of a NanoCycler to a customer in the United States. The equipment will be deployed to characterize NAND memory devices, configured to support the specific requirements of radiation testing and aerospace qualification. 

The order underscores NanoCycler’s proven capability to deliver highly accurate, package-level characterization data—covering aging, endurance, retention, timing, and power profiling—under the demanding conditions required by mission-critical aerospace systems. Its fully independent per-package test architecture allows engineers to tailor test flows precisely to radiation and environmental test protocols, making it a natural fit for space and defense-grade qualification work. 

Tamas Kerekes, President and CEO of NplusT, comments: “The project is another important milestone of our activities for the aerospace industry, started with a project launched in 2025 with ESA, PCB Design and Thales, and now reaching its final stage. This new delivery confirms the relevance of our technology for radiation testing and aerospace-grade qualification, and reflects the growing international recognition of NanoCycler as a reference NAND characterization platform.” 



August 26, 2026

We are pleased to announce a new release of the NanoCycler library, delivering significant performance improvements for NAND BER (Bit Error Rate) collection and datalog generation.

Over time, we identified that one of the main performance limitations of the Python library was the time required to calculate NAND page bit errors and generate the associated datalog. This overhead could have a noticeable impact on total execution time, particularly for complex test flows.

With WS version 4.3.3, NanoCycler now includes native, integrated datalog support, substantially accelerating failure collection and reducing overall execution time by more than 3×.

For example, a complete TLC block of approximately 2,000 pages, tested across all Read Retry entries, now takes approximately:

20 seconds → 6 seconds

This optimization applies broadly to operations that require NAND BER extraction and generation of test log reports.

The result is faster test execution, more efficient failure analysis, and improved productivity for NAND characterization and reliability testing.



August 23, 2025

NplusT today announced two important upgrades to its NanoCycler HS24 product line, enhancing performance and extending applicability for NAND characterization.

New NanoCycler HS24 BGA154 Tester Unit (rev2)

The new version of the NanoCycler HS24 BGA154 tester unit introduces standby current measurement with approx. 1 µA resolution, enabling more precise power characterization. The updated unit maintains full mechanical and software compatibility with existing systems and will be available at the same price as the previous version. Orders are open now, with deliveries starting in 3–4 months.

Industrial Temperature Range Configuration

NplusT has created a specific version and qualified both the HS24 BGA152 and BGA154 tester units for the industrial temperature range, enabling reliable testing of SSD devices for automotive and industrial applications. Integration with a climatic chamber is required, and NplusT offers engineering support to ensure smooth implementation.

“Our mission is to help SSD makers understand the behavior of the most recent NAND devices, accelerate development and ensure product reliability under real-world conditions,” said Tamas Kerekes, President and CEO of NplusT. “With these upgrades, the NanoCycler platform is now even more versatile, addressing the demanding requirements of industrial and automotive markets.”

For more information, please contact:

Davide Zini
Sales Director
davide.zini@n-plus-t.com

or one of our sales partners.



September 27, 2024

NplusT’s technology was recently featured in a research publication and played a critical role in enabling precise data collection and testing. Using NanoCycler as core tool for acquiring real-device data during the entire NAND life cycle, Luo Zheng’s dissertation, titled “Research and Development of Efficient Testing Technology for Ultra-large Capacity 3D Flash Memory”, delves into enhancing the reliability and lifespan of 3D NAND flash memory.

Written under the guidance of Prof. Han Guojun at the Department of Electronic Information, Guangdong University of Technology, in Guangzhou, China, the research focuses on developing machine learning models to accurately predict flash memory lifespan. The work aims to optimize storage system performance by reducing the impact of noise on lifespan prediction accuracy.

The NplusT team extends their congratulations to Luo Zheng for earning the degree of Master of Electronic Information.



September 29, 2023

Nplust’s CTO Nicola Campanelli was a speaker at the recent Italian Mathematical Union conference Cryptography and Coding, held at University of Perugia’s Mathematics and Computer Science Department on September 21-22, 2023.

The presentation, titled “The Coding Theory ​in Flash Memory Applications” highlighted the theory’s importance in error correction, data degradation detection, and data loss prevention strategies when using high performance NAND memories. The presentation is available at this link.



May 24, 2023

Leaders in flash memory management technology will provide comprehensive design, testing services to industrial, automotive, medical, and aerospace sectors.

– Tuxera and NplusT, two leaders in flash memory management technology, announced a partnership to provide a novel suite of value-added services, from flash testing and characterization to advanced flash management software. The partnership is aimed at helping customers bring safety-critical and high-reliability products to market more quickly and at lower costs.

Based in Finland, Tuxera is an international leader in developing quality-assured software for flash management, file system management, and networking, powering billions of devices, cars, and public cloud platforms worldwide. NplusT, located in Italy and known for shortening development times for its customers, is a provider of the fastest and most affordable solutions for characterization, testing and reliability verification of NAND and other non-volatile memory devices.

Officials of the two companies described their new partnership as “the best of both worlds.”

“NplusT has great experience on the hardware side—how to do NAND characterization, how to help the customer design the device so that they can produce it quickly, and all the while removing some of the risks,” said Marko Finnig, Vice President of Product Management at Tuxera. “So then the question is, how do you actually manage the NAND? That’s where Tuxera comes in. We create the flash translation layer, software that manages the NAND, and the file system on top of it. This allows our customers to create cost-effective devices that are reliable. So you get the best of both worlds—you get the cost-effectiveness, but you also get the reliability.”

“Tuxera has great software for managing storage at a high level, independent of component management,” said Tamas Kerekes, President and CEO of NplusT. “What NplusT adds to Tuxera is low-level memory know-how, which is critical and important in two areas. There is the NAND chip itself, which requires very specific algorithms, which is one area of our expertise, coming from working with customers in the characterization. And the other is our knowledge of new memory technologies and characterization with semiconductor manufacturers.”

Kerekes said the partnership unites the strengths of his company and Tuxera to create something greater than the sum of its parts.

“This kind of strong cooperation between companies can create a much better product than what comes from trying to integrate two products from different companies,” Kerekes added. “We can do native integrations, which will deliver more performant and reliable results in the end.”

Tuxera and NplusT see the partnership as bringing benefits to both companies’ client bases, as it will introduce NplusT’s capabilities in flash memory testing to Tuxera’s broad spectrum of industry clients, and connect Tuxera’s flash controller and flash enablement software to the semiconductor manufacturers with whom NplusT works closely.

The partnership also will open the door to potential joint research and development efforts that can create solutions to better serve the needs of Tuxera’s and NplusT’s customers in the embedded market, the companies said.

Unlike traditional partnerships, the association between Tuxera and NplusT is not tied to the production of a specific product but instead is a comprehensive package of services that can be tailored to specific clients. Tuxera and NplusT encourage potential customers to contact them early in the product design phases in order to best leverage the companies’ full complement of skills.



October 13, 2022

NplusT is proud to announce the general availability of NanoCycler HS24, an upgraded version of the HS20. Using HS24, our partners are able to characterize the array performance, power consumption and interface timing of every NAND device at its highest operational speed, with full coverage of the ONFi 5.0 specification. HS24 is available for BGA132, BGA152 and BGA154 packages.

HS24 maintains all advanced features of the NanoCycler family: characterization in the full range of speed-temperature-voltage conditions, at extreme accuracy and flexibility. HS24 is software compatible with the HS16 and HS20 product versions.

 

 


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