characterization

Advanced characterization environment for PCM (Phase Change Memory) test arrays

Since 2011, NplusT has presented the MOCCA (MOst Creative Customer Award) annually to recognize and celebrate the user team that demonstrates outstanding creativity in applying NplusT products to innovative and impactful projects. The award reflects the shared commitment to exploration, collaboration, and technological advancement.
For 2025, the MOCCA Award has been granted to the STMicroelectronics, Global Technology R&D – PCM Excellence Center team, composed of Giulia Samanni (ePCM Process Architecture & Device Reliability Staff Engineer), Enrico Gomiero (ePCM Device Architecture & Design Principal Engineer) and Alessandro Motta (ePCM Characterization Staff Engineer), and managed by Roberto Annunziata, for the creation of an advanced characterization environment for PCM (Phase Change Memory) test arrays.
Through their innovative approach, the STMicroelectronics team has developed a solution, based on NplusT’s TESTMESH TMA-100 instrumentation platform, that greatly enhances the speed and efficiency of device characterization, opening new opportunities for deeper analysis and faster iteration in memory technology development. Their project exemplifies how close collaboration and creative application of NplusT tools can translate into tangible performance breakthroughs.
Tamas Kerekes, President and CEO of NplusT, commented:
“Working with the STMicroelectronics team was a perfect example of how shared technical curiosity and mutual trust can accelerate innovation. Their forward-thinking use of our NVM characterization tools to build a highly efficient PCM test environment not only demonstrates exceptional creativity but also sets a new benchmark for characterization speed. We are proud to see such a clear alignment between our vision and their execution.”
Roberto Annunziata, Global Technology R&D – PCM Excellence Center Director, STMicroelectronics:
“NplusT provided a perfect framework for an effective collaboration. Technical expertise of our partners and strong motivation to find solutions enabled working as a unique team, exploiting the wide field of competencies. Results jointly achieved are a value for the current projects and an example for future collaborations in different domains.”

The STMicroelectronics Global Technology R&D PCM Excellence Center team and NplusT's CTO Nicola Campanelli — The STMicroelectronics Global Technology R&D PCM Excellence Center team and NplusT’s CTO Nicola Campanelli

NplusT today announced two important upgrades to its NanoCycler HS24 product line, enhancing performance and extending applicability for NAND characterization.

New NanoCycler HS24 BGA154 Tester Unit (rev2)

The new version of the NanoCycler HS24 BGA154 tester unit introduces standby current measurement with approx. 1 µA resolution, enabling more precise power characterization. The updated unit maintains full mechanical and software compatibility with existing systems and will be available at the same price as the previous version. Orders are open now, with deliveries starting in 3–4 months.

Industrial Temperature Range Configuration

NplusT has created a specific version and qualified both the HS24 BGA152 and BGA154 tester units for the industrial temperature range, enabling reliable testing of SSD devices for automotive and industrial applications. Integration with a climatic chamber is required, and NplusT offers engineering support to ensure smooth implementation.

“Our mission is to help SSD makers understand the behavior of the most recent NAND devices, accelerate development and ensure product reliability under real-world conditions,” said Tamas Kerekes, President and CEO of NplusT. “With these upgrades, the NanoCycler platform is now even more versatile, addressing the demanding requirements of industrial and automotive markets.”

For more information, please contact:

Davide Zini
Sales Director
davide.zini@n-plus-t.com

or one of our sales partners.

Join us at the International Memory Workshop 2025 to discover our solutions designed for rapid and accurate characterization of emerging non-volatile memory technologies, facilitate faster time-to-market and enhanced engineering productivity.

📅 [May 18th-21st 2025] | 📍 [Monterey, CA, USA]
🔗 [IEEE IMW 2025]

NplusT’s technology was recently featured in a research publication and played a critical role in enabling precise data collection and testing. Using NanoCycler as core tool for acquiring real-device data during the entire NAND life cycle, Luo Zheng’s dissertation, titled “Research and Development of Efficient Testing Technology for Ultra-large Capacity 3D Flash Memory”, delves into enhancing the reliability and lifespan of 3D NAND flash memory.

Written under the guidance of Prof. Han Guojun at the Department of Electronic Information, Guangdong University of Technology, in Guangzhou, China, the research focuses on developing machine learning models to accurately predict flash memory lifespan. The work aims to optimize storage system performance by reducing the impact of noise on lifespan prediction accuracy.

The NplusT team extends their congratulations to Luo Zheng for earning the degree of Master of Electronic Information.

A leading European semiconductor manufacturer has chosen NplusT’s TESTMESH TMA-100 for the characterization of new emerging non-volatile technology devices. The decision was based on the significant speed advantage that TMA-100 offers, being several hundred times faster than competitive solutions.

NplusT – as gold sponsor of the event – will exhibit the TESTMESH non-volatile memory test system, aiming to accelerate the bring-up of novel technologies for data storage and in-memory neuromorphic computing.

Technology researchers and product developers benefit from a compact, all-in-one instrument, embedding all resources necessary for the characterization. They can focus on the analysis rather than spending time and effort for the integration of a complex test bench. TESTMESH’s speed-optimized architecture and the engineering-oriented software accelerates their process to obtain reliable results.

Looking forward to meet you, see you in Seoul!

As a tradition spanning more than a decade, NplusT assigned the MOCCA award also in 2023, honoring the user of NplusT products and services demonstrating the highest creativity, imagination, and dedication.

This year, the award was granted to the team of Weebit Nano, a provider of ReRAM non-volatile memory (NVM) technology, for their introduction of the TESTMESH TMA-100 NVM characterization equipment in their workflow. The Weebit team includes: Ori Livne, Director of Testing; Alessandro Bricalli PhD, R&D Engineer; Giuseppe Piccolboni PhD, R&D Engineer; and Matan Guttman, Test Engineer.

Tamás Kerekes, President and CEO of NplusT:

I have been following Weebit Nano since their very early days and I was impressed by how quickly the team was able to bring up a very new, extremely challenging technology. I am happy to support the company on their path to success. Weebit Nano is among the first users of our latest non-volatile memory characterization equipment, TESTMESH TMA-100, and certainly the first to apply it across multiple stages of technology development, from basic test devices to complex modules with embedded micro and digital interface. I am looking forward to continuing being part of Weebit Nano’s technology evaluation process.

Ilan Sever, VP of R&D, of Weebit Nano:

When developing a new memory technology like Weebit ReRAM, selecting the best testing and characterization solutions is a priority. We are delighted to partner with the team at NplusT, making its TESTMESH TMA-100 a key part of our flow. Together we designed the software, load boards and probe cards, going deep into every technical aspect.
At Weebit Nano, our products often have distinct working methodologies, and the TMA-100 easily accommodates these different procedures. This includes for example the ability to easily collaborate on the same platform with our R&D partner CEA-Leti.
Across our developments, the TMA-100 has saved us a lot of time and effort through product flexibility, the ability to reuse past developments, and the close support we receive from NplusT.

Weebit’s Ori Livne (left) and Matan Guttman (right) with the TESTMESH TMA-100

NplusT is proud to announce the general availability of NanoCycler HS24, an upgraded version of the HS20. Using HS24, our partners are able to characterize the array performance, power consumption and interface timing of every NAND device at its highest operational speed, with full coverage of the ONFi 5.0 specification. HS24 is available for BGA132, BGA152 and BGA154 packages.

HS24 maintains all advanced features of the NanoCycler family: characterization in the full range of speed-temperature-voltage conditions, at extreme accuracy and flexibility. HS24 is software compatible with the HS16 and HS20 product versions.

NplusT has released NanoCycler HS20 for BGA132, BGA152, and BGA154 configurations, the fastest and most feature-rich NAND characterization tester today, supporting 2.0 GT/sec NAND interface speed.
The company forecasts to come out with a further upgrade later this year, to reach 2.4GT/sec.

For more info, please see the complete Press Release or StorageNewsletter.com.

NplusT announces it has been granted a new patent entitled “Sistema per la caratterizzazione di memorie non volatili” (“Non-volatile Memories Characterization System”).
The patented technology expands upon the company’s intellectual property rights relating to non-volatile memory testing and characterization and has been successfully integrated into the NanoCycler test system.

Thanks to its proprietary architecture, NanoCycler proves to be the leading solution for the industry’s most demanding NAND characterization needs, providing outstanding scalability (from single-socket development station until multiples of 84-socket racks), full, per-package independency for test execution and temperature control, cutting edge performance with data transfer up to 2.0GT/sec (2.4GT/sec coming soon) and an overall unmatched feature-rich hardware and software solution; to help SSD developers to increase lifetime and reliability of their products.

MOCCA 2025 awarded to STMicroelectronics

NplusT Announces Major Upgrades to NanoCycler Product Line for NAND Characterization

NplusT at IMW 2025

NanoCycler Powers Research in 3D Flash Memory Lifespan Prediction: Luo Zheng Earns Master’s Degree at Guangdong University of Technology

New Purchase Order for TESTMESH TMA-100

Visit us at the International Memory Workshop – Seoul, 12-15 May 2024!

MOCCA 2023 awarded to Weebit Nano

NanoCycler HS24 – The First and Only Characterization Tester for ONFI 5.0 NAND at 2.4 GT/sec

NplusT releases NanoCycler HS20

New Patent granted to NplusT

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