We are excited to announce the release of TME-101, a customized small-size non-volatile memory cycling system designed for the qualification of NVM macros.

TME-101 combines the capabilities of a single-device precision tester with parallel operation, enabling engineers to obtain solid statistical insight without compromising on signal quality.
A key strength of the system is its high-accuracy signal generation and precise measurement capability, supporting detailed characterization throughout the cycling process.

Another distinctive feature is the integrated temperature control, which eliminates the need for an external climatic chamber. The system provides:

• Very fast and accurate temperature transitions
• Independent temperature control on each socket

This approach allows reliability profiles to be built quickly, with controlled and repeatable conditions on every device.

TME-101 is the first in a series of upcoming configurations designed to address the growing need for accurate device management and deep data collection, which traditional chamber-based cyclers struggle to provide. At the same time, this architecture remains significantly more cost-effective than general-purpose parallel test systems.

More breakthroughs are coming.