Recipe editing in NanoCycler – NAND Characterization

Understand Vt distribution shift as effect of aging and stresses.
Use NanoCycler’s built-in functions for Aging, Retention, Disturbs, …
Use built-in functions to read out blocks at several read levels.
Post-process data, generate charts.
Use data to select the best Vt to minimize Read errors. Compute expected errors by Page, WL …

Understand the effect of Read Disturb on the data error rate.
Use built-in functions for Aging and Read Disturb.
Use built-in functions to read out data error at different read levels.
Post-process data, generate charts.
Select the best Vt offset to minimize errors.

Understand the error correction effort and limits over lifetime (endurance) with use case stress conditions.
Use built-in functions for Aging and Stress.
Use built-in functions to extract RBER at Default and different read levels
Identify the optimal read offset at every condition.
Post-process RBER data with ECC/LDPC correction capability thresholds
Generate automatically comprehensive report in PDF.
Define methods / policies for read level settings and error correction strategies.

Understand the effect of the temperature over NAND operations, simulating Industrial, Automotive, Aerospace, … applications.
Use built-in functions for Temperature Control, Program.
Use built-in functions to read out data error at different read levels.
Post-process RBER data, generate charts.
Select the optimal read levels to minimize errors, considering the operating temperature.

Understand dynamic current and power characteristics for the different NAND operations.
Use built-in functions for Power Supplies settings and Current Waveform capture.
Use built-in functions to run NAND operations and acquire current consumption traces.
Design storage device / SSD power supplier circuits and PCB layout
Optimize firmware to avoid simultaneous peaks.