VIRTES Testing


High Accuracy Characterization and Reliability Test Equipment for Optoelectronic Devices

  • Up to 2048 devices tested in parallel
    • Independent current generators
    • Continuous voltage and current monitor
  • Stability for very long test times
    • Continuous self-test and self-monitor
    • Detection of minimal device degradations
  • Embedded in-system characterization functions
    • IV curves during stress
    • Optical power measurement
    • No need to remove the devices for characterization