Characterizing Image Sensors based on NVM Testing Techniques

October 2, 2020

Building on their successful memory testing technology, NplusT has extended this expertise to the design, validation and characterization of image sensor devices.

Physical View of Cell Currents

The array-organized analog cell structure of the image sensor is similar to non-volatile memory and lends itself to the reuse of the core NplusT memory testing technology that has been production-proven for decades.

 

Distribution of currents after post-processing

Specific needs of data analysis to support image sensors has resulted in additional innovation with the extension of BarnieMAT, NplusT’s popular array data analysis tool, adding an additional library containing processing functions dedicated to image sensors.

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