VIRTES Testing


High Accuracy Characterization and Reliability Test Equipment for Optoelectronic Devices

  • Up to 2048 devices tested in parallel
    • Independent current generators
    • Continuous voltage and current monitor
  • Stability for very long test times
    • Continuous self-test and self-monitor
    • Detection of minimal device degradations
  • Embedded in-system characterization functions
    • IV curves during stress
    • Optical power measurement
    • No need to remove the devices for characterization
Timing Analyzer

Timing Analyzer

  • Characterization up to 1.6 GT/sec
  • Programmable signal timing
Characterization Services

Characterization Services

Fully Integrated SSD-NAND Characterization Flow

  • Understand the NAND
    • Endurance, retention, degradation characteristics
    • Read, write, program times and distributions
    • Suspend and BER impact
  • Understand LDPC ECC
    • Hard decode using soft values
    • Choice of LLR and impact on performance
    • Frequency of use of soft LDPC
  • Set clear SSD Requirement
    • Endurance
    • Retention tradeoffs
    • Performance, latency, QoS, power targets
    • Usage models