RIFLE Engineering Test System
Fast Time-To-Result and Best Cost of Ownership For Memory and Microcontroller Characterization
(in cooperation with Active Technologies)
RIFLE-SE: Extreme Analog Performance
RIFLE-M: One Tester Per Engineer
RIFLE-MC: Cycling with ATE Features
- Optimized for NVM Testing
- 100MHz arbitrary waveform generators
- 70Msample/sec accurate cell current measurement
- Full synchronization between digital sequencer, waveform generators and PMU
- Protocol-Based Approach
- Programmable communication protocol
- Increased visibility through algorithmic device management
- Software Environment for Engineering Usage
- True interactive testing
- Easy-to-use IDE for test creation and debug
- Natively integrated on-the-fly data analysis
- Desktop installation
- Small footprint
- No need of lab facility
- Package and wafer testing
- Per device temperature control
BarnieMAT Bitmap Analysis Software
Analysis you've Never Even Dreamed of BeforeFast Learning of Array Effects
- Hundreds of ready-to-use array processing functions
- Speed optimized processing engine for large arrays
- Cell classification using an innovative filtering concept
- Shape recognition
- Best-in-class presentation tools
- Analog bitmap viewer
- Interactive processing and cell highlight
- 2D and 3D distribution view and statistics
- Wide range of applications
- Technology and product development
- Engineering analysis of production data
- Input generation for machine learning