BarnieMAT Bitmap Analysis Software

 Analysis you've Never Even Dreamed of Before 

Fast Learning of Array Effects

  • Hundreds of ready-to-use array processing functions
    • Speed optimized processing engine for large arrays
    • Cell classification using an innovative filtering concept
    • Shape recognition
  • Best-in-class presentation tools
    • Analog bitmap viewer
    • Interactive processing and cell highlight
    • 2D and 3D distribution view and statistics
  • Wide range of applications
    • Technology and product development
    • Engineering analysis of production data
    • Input generation for machine learning

See multimedia presentation

RIFLE Engineering Test System

Fast Time-To-Result and Best Cost of Ownership For Memory and Microcontroller Characterization
(in cooperation with Active Technologies)

RIFLE-SE: Extreme Analog Performance


RIFLE-M: One Tester Per Engineer


RIFLE-MC: Cycling with ATE Features

  • Optimized for NVM Testing
    • 100MHz arbitrary waveform generators
    • 70Msample/sec accurate cell current measurement
    • Full synchronization between digital sequencer, waveform generators and PMU
  • Protocol-Based Approach
    • Programmable communication protocol
    • Increased visibility through algorithmic device management
  • Software Environment for Engineering Usage
    • True interactive testing
    • Easy-to-use IDE for test creation and debug
    • Natively integrated on-the-fly data analysis
  • Desktop installation
    • Small footprint
    • No need of lab facility
    • Package and wafer testing
    • Per device temperature control