Characterization Solution for NAND Testchip Print
Friday, 07 August 2009 07:55
NplusT developed and successfully validated a turn-key solution for NAND testchip characterization, for an undisclosed customer. In this project, NplusT participated in the specification of the testchip device, providing input for improved testability. This optimization allows an extremely high performance, speed and accuracy, not only of the basic operations like read and program, but also detailed measurements as Icell and Vt maps.
Last Updated ( Tuesday, 01 September 2009 10:23 )