Politecnico di Torino, one of the top Italian universities, and NplusT signed a research agreement. In the frame of the cooperation, the team coordinated by Dr. Paolo Bernardi, within the Electronic CAD & Reliability Group of the Dipartimento di Automatica and Informatica, is going to identify data reduction algorithms for extracting fail signatures of semiconductor devices, starting from test data log. Specific focus is on the post-processing of BIST results on system-on-chips and RAM devices.

The new algorithms will be integrated into NplusT existing and new generation data analysis tools. The improved characteristics increase the efficiency of the end users in the execution of their analysis tasks, thus NplusT's competitive position is supposed to improve significantly.