Politecnico di Torino, one of the top Italian universities, and NplusT signed a research agreement. In the frame of the cooperation, the team coordinated by Dr. Paolo Bernardi, within the Electronic CAD & Reliability Group of the Dipartimento di Automatica and Informatica, is going to identify data reduction algorithms for extracting fail signatures of semiconductor devices, starting from test data log. Specific focus is on the post-processing of BIST results on system-on-chips and RAM devices.

The new algorithms will be integrated into NplusT existing and new generation data analysis tools. The improved characteristics increase the efficiency of the end users in the execution of their analysis tasks, thus NplusT's competitive position is supposed to improve significantly. 

Fraunhofer CNT and NplusT kicked off a cooperation project targeting joint research and characterization services to the semiconductor industry. The companies teamed up to provide support for small and mid size companies, in order to validate their design and bring their products in production. Services will be provided in the Fraunhofer laboratory, using NplusT custom tooling. Benefitting our services, customers do not need to face high, often prohibitive initial investments in tooling and in know-how, they can purchase laboratory equipment once the business is up and efficiency is demonstrated.

Special focus will be given on non-volatile memory technologies (embedded and stand-alone) where both partners acquired a significant amount of knowledge and experience.