Articles
Parallel (multi-channel, multi-die, multi-LUN) Testing using NanoCycler
Jan 2022Current and upcoming generations of 3D NAND devices push the IO speed at/beyond 1.6 GT/sec, delivering unprecedented performant to meet the demands of SSDs for storage systems, data centers and real-time applications at the edge.
In order to get reliable and representative data for the actual application, NAND characterization has to run at full speed with high accuracy on a large enough number of samples.
The latest generation of NanoCycler has been engineered to answer these new challenges: it enables full-speed ONFi5 tests with unconstrained parallelism inside each device and across hundreds of devices.
Read article
How NanoCycler can help making a perfect SSD from imperfect NANDs
Mar 2022How NanoCycler can help making a perfect SSD from imperfect NANDs.
Read article
Understanding Your Memory Test Data
Mar 2022Whenever you are evaluating your new memory technology or you are bringing up your new product towards the target production yield, you need efficient software which helps you in understanding your test data.
BarnieMAT has been created for just this purpose.
Read article
High Volume NAND Characterization from Engineering to Qualification and Production Support
Jul 2022Whenever you are evaluating a new memory technology for your upcoming solid-state storage product, or you are getting ready to qualify a new product to ramp up production with quality, reliability, and yield targets, you need an efficient and productive system that can deliver deep, detailed information about the NAND through every stage.
NanoCycler’s features and scalability help users tailor the equipment configuration based on their current requirement and easily extend the system as the capacity need grows. Find out how.
Read article