Articles
Parallel (multi-channel, multi-die, multi-LUN) Testing using NanoCycler
Jan 2022Current and upcoming generations of 3D NAND devices push the IO speed at/beyond 1.6 GT/sec, delivering unprecedented performant to meet the demands of SSDs for storage systems, data centers and real-time applications at the edge.
In order to get reliable and representative data for the actual application, NAND characterization has to run at full speed with high accuracy on a large enough number of samples.
The latest generation of NanoCycler has been engineered to answer these new challenges: it enables full-speed ONFi5 tests with unconstrained parallelism inside each device and across hundreds of devices.
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How NanoCycler can help making a perfect SSD from imperfect NANDs
Mar 2022How NanoCycler can help making a perfect SSD from imperfect NANDs.
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Understanding Your Memory Test Data
Mar 2022Whenever you are evaluating your new memory technology or you are bringing up your new product towards the target production yield, you need efficient software which helps you in understanding your test data.
BarnieMAT has been created for just this purpose.
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